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Determination of band alignments at 2D tungsten disulfide/high-k dielectric oxides interfaces by x-ray photoelectron spectroscopy

Impact Factor: 7.39
Journal: Applied Surface Science
Note: Zhou Changjie,Zhu Huili,Pan Shaobin,Zheng Tongchang,Huang Xiaojing,Lin Qiubao,Yang Weifeng,
Translation or Not: no
Date of Publication: 2020-01-01

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