Power Semconductor Laboratory
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Determination of band alignments at 2D tungsten disulfide/high-k dielectric oxides interfaces by x-ray photoelectron spectroscopy

  • Impact Factor:7.39
  • Journal:Applied Surface Science
  • Note:Zhou Changjie,Zhu Huili,Pan Shaobin,Zheng Tongchang,Huang Xiaojing,Lin Qiubao,Yang Weifeng,
  • Translation or Not:no
  • Date of Publication:2020-01-01
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