InAlN/GaN MISHEMT with plasma enhanced atomic layer-deposited ZrO2 as gate dielectric
发布时间:2023-04-04
点击次数:
- 影响因子:
- 1.491
- 发表刊物:
- Japanese Journal of Applied Physics
- 备注:
- P Cui, J Zhang, M Jia, G Lin, L Wei, H Zhao, L Gundlach, Y Zeng
- 是否译文:
- 否
- 发表时间:
- 2020-01-01

