一种检测痕量汞离子的电化学方法

Affilication of Author(s):

厦门大学

Disigner of the Invention:

刘国坤,邹义松,卢江龙,郑红,王炬勇,张玉龙,田中群

Application Number:

201811047603.1

Number of Inventors:

7

Service Invention or Not:

yes

Application Date:

2018-09-07